- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 40/00 - Calibration, e.g. of probes
Patent holdings for IPC class G01Q 40/00
Total number of patents in this class: 92
10-year publication summary
12
|
6
|
9
|
8
|
7
|
2
|
2
|
5
|
6
|
1
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2362 |
9 |
Infinitesima Limited | 62 |
8 |
Oxford Instruments Asylum Research, Inc. | 34 |
7 |
Bruker Nano, Inc. | 334 |
5 |
Centre National de La Recherche Scientifique | 9632 |
3 |
University Court of The University of ST Andrews | 305 |
3 |
Seagate Technology LLC | 4228 |
2 |
Carl Zeiss SMT GmbH | 2646 |
2 |
Ecole Normale Superieure de Lyon | 220 |
2 |
Horiba Jobin Yvon SAS | 50 |
2 |
Hysitron, Inc. | 35 |
2 |
Universite Claude Bernard Lyon 1 | 921 |
2 |
Veeco Instruments Inc. | 332 |
2 |
Ouster, Inc. | 163 |
2 |
Paris Sciences et Lettres - Quartier Latin | 170 |
2 |
Sorbonne Universite | 1068 |
2 |
Nearfield Instruments B.V. | 34 |
2 |
Samsung Electronics Co., Ltd. | 131630 |
1 |
International Business Machines Corporation | 60644 |
1 |
Hitachi, Ltd. | 16452 |
1 |
Other owners | 32 |